Starting year 2002, Chroma has been investing huge amount of human and financial resources to develop the test systems for IC. With the cooperation of the government, the industry, and the academy, Chroma was able to launch its first VLSI test system in Taiwan to supply Semiconductor business locally produced test equipment.
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 The Chroma 3280 is an innovative integration system for testing and handling SD cards in parallel without picking any part before sorting. SD Protocol Aware and Focused DC tests in the 3280 brings a revolutionary test methodology to all SD cards (include MMC). The benefit to customers is lower manufacturing cost from the high throughput of the 3280. The compact size of 3280 also saves floor space in the manufacturing facility.  Tester & Handler Integration Test 120pcs micro SD in parallel Test-in-Tray, no pick & place arm before sorting UPH = 5400 with 70 sec test time SD Protocol Aware Tester DC Measurements 32MB Buffer Memory per site Microsoft Windows XP OS Software provides tray map and binning information Compact Size: 164cm X 79cm X 180cm Options: - 3rd party test tools - Change Kits for mini SD, SD and MMC - Loading Content | |||||||||||